If there's a truism in design debug and test, it's that the earlier you can find a bug, the less costly it is to fix. Thus, finding bugs at RTL is far preferable to finding them after synthesis. With ...

A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

Vijay Sontakke, who works at Intel Corporation as a design engineer, has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing. His ...

TOKYO, May 08, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled SiConic Test Engineering (TE), the newest addition to the SiConic ...

If your circuit design has requirements to be tolerant to certain faults and to report their occurrence, you’ll need to test the fault detection and protection features of your design during the test ...

Norma Dorst is Vice President, Global Marketing for NI Test and Measurement at Emerson, where she leads global marketing strategy across brand, demand, partners, and field marketing. A technical ...