Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal ...

Two studies, led by Rajiv Malhotra have illustrated how AI can support the broader use and faster evolution of AM technology.

As electric vehicles surge onto our roads and portable devices dominate our daily lives, lithium-ion batteries have become the invisible powerhouses of modern technology. Yet beneath their sleek ...

It’s simply not enough to mention there is a gap between R&D and manufacturing. There must be some practical steps to be put in place to overcome these issues if a company wants to be successful in ...

So, wire arc additive manufacturing, or WAAM as folks in the know call it, is pretty neat. It’s basically a fancy way to ...

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...