Typically, we see a 4X increase in memory size every 3 years to cater to the needs of new generation devices. Deep submicron devices contain a large number of memories which demands lower area and ...
Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
MOUNTAIN VIEW, Calif., Nov. 15, 2016 – Synopsys, Inc. (Nasdaq: SNPS) today announced that Imagination Technologies is leveraging Synopsys' DesignWare® STAR Memory System® for memory built-in self-test ...
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