Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

With the proliferation of wireless products, chip designers are increasingly required to integrate RF and digital functions within single system-on-chip (SOC) implementations. This integration melds ...

A tough challenge for test engineers is explored in terms of test methods, pitfalls, and measurement errors. For the test engineer, RF and microwave power amplifier testing imposes unique challenges.

Modern radio frequency (RF) components introduce many challenges to outsourced semiconductor assembly and test (OSAT) suppliers whose objective is to ensure products are assembled and tested to meet ...

Scalable Card Offers Future-Proof 100MHz–20GHz Bandwidth for All RF Applications, Solves Test Challenges for Wide-Bandwidth Applications, Including Wi-Fi 7 and UWB TOKYO, Nov. 18, 2024 (GLOBE NEWSWIRE ...