A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

Scanning electron microscope images of trona found in samples of the asteroid Bennu returned by NASA’s OSIRIS-REx mission. Trona is water-bearing sodium carbonate, also known commonly as soda ash.

“Nanowonder: Images from the Microscopic World” is a new exhibit on display in the Rozsa Art Galleries featuring photographs taken by a high-powered electron scanning microscope. × Butterfly wings, ...

Tim McCoy (right), the Smithsonian’s National Museum of Natural History curator of meteorites and the co-lead author on the new paper, with Cari Corrigan (left) sein a scanning electron microscopy lab ...

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, Goethe University in Frankfurt (Germany) is expanding its research infrastructure with a ...

Images: Carolin Dreher, Jeremiah Shuster Scanning electron microscope images of the spherical cyanobacteria Synechococcus sp.

Atoms measure roughly 0.1 nanometers across, a scale so small that scientists spent more than six decades developing instruments capable of resolving them with any clarity. The journey from the first ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...