Device test times also are rising dramatically. Longer test times are driven by higher levels of embedded memory, higher functionality, higher quality requirements, and the need to move more tests to ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.