Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
The August print issue of EE-Evaluation Engineering includes a special report on power electronics test. In preparation for that article, we asked test equipment vendors to provide information on ...
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