Abstract: In sub-28-nm nodes, existing optical critical dimension (OCD) metrology tools are challenging to simultaneously and thoroughly meet the metrology requirements of the wafer-level ...
Mr. Khan is the C.E.O. of Khan Academy and the vision steward at TED, both nonprofits that provide free online education for more than 200 million learners globally. On my way to meet a friend in ...
Abstract: Visual Analytics (VA) researchers frequently collaborate closely with domain experts to derive requirements and select appropriate solutions to fulfill these requirements. Despite strides ...
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